Cellular-automata models for reliability analysis of systems on silicon

IEEE Transactions on Reliability

Volumn 46, Issue 2, 1997, Pages 173-183

  Macii, Enrico ^a   Poncino, Massimo ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Cellular automaton; Cmos digital circuit; Power dissipation

Indexed keywords

AUTOMATA THEORY; CMOS INTEGRATED CIRCUITS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ELECTRIC LOSSES; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; RELIABILITY; VLSI CIRCUITS;

CELLULAR AUTOMATON;

SEMICONDUCTING SILICON;

EID: 0031170434     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589944     Document Type: Article

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