A Deterministic Built-in Self-Test Generator Based on Cellular Automata Structures

IEEE Transactions on Computers

Volumn 44, Issue 6, 1995, Pages 805-816

  Boubezari, Samir ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

autonomous finite state machine; built in self test; Cellular automata; programmable logic array; test vector generator

Indexed keywords

COMBINATORIAL CIRCUITS; ELECTRIC NETWORK SYNTHESIS; FINITE AUTOMATA; LOGIC CIRCUITS; SEQUENTIAL MACHINES; VECTORS; VLSI CIRCUITS;

AUTONOMOUS FINITE STATE MACHINE; BUILT IN SELF TEST; CELLULAR AUTOMATA; CIRCUIT UNDER TEST; PROGRAMMABLE LOGIC ARRAY; TEST VECTOR GENERATOR;

INTEGRATED CIRCUIT TESTING;

EID: 0029322390     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.391181     Document Type: Article

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