-
3
-
-
0018996451
-
Testing VLSI with random-access scan
-
Feb.
-
H. Ando, “Testing VLSI with random-access scan,” Compcon 80, pp. 50–52, Feb. 1980.
-
(1980)
Compcon
, vol.80
, pp. 50-52
-
-
Ando, H.1
-
4
-
-
3543080439
-
Future testing of large LSI circuit cards
-
Oct.
-
J.H. Stewart, “Future testing of large LSI circuit cards,” in IEEE Semiconductor Test Symp., pp. 6–17, Oct. 1977.
-
(1977)
IEEE Semiconductor Test Symp.
, pp. 6-17
-
-
Stewart, J.H.1
-
6
-
-
0022044251
-
Built-in self-test techniques
-
Apr.
-
E.J. McCluskey, “Built-in self-test techniques,” IEEE Design Test. pp. 21–28, Apr. 1985.
-
(1985)
IEEE Design Test.
, pp. 21-28
-
-
McCluskey, E.J.1
-
7
-
-
0018809824
-
Built-in logic block observation techniques
-
Oct.
-
B. Konemann, J. Mucha, and G. Zwiehoff, “Built-in logic block observation techniques,” in Proc. 1979 Int. Test Conf., pp. 37–41, Oct. 1979.
-
(1979)
Proc. 1979 Int. Test Conf.
, pp. 37-41
-
-
Konemann, B.1
Mucha, J.2
Zwiehoff, G.3
-
9
-
-
0022305008
-
Concatenable polydividers: Bit-sliced LFSR chips for board self-test
-
D.K. Bhavsar, “Concatenable polydividers: Bit-sliced LFSR chips for board self-test,” 1985 Int. Test Conf., pp. 88–93, 1985.
-
(1985)
1985 Int. Test Conf.
, pp. 88-93
-
-
Bhavsar, D.K.1
-
10
-
-
33747129507
-
-
Ph.D. dissertation, Univ. of Manitoba, Winnipeg, Canada
-
P.D. Hortensius, “Parallel computation of nondeterministic algorithms in VLSI,” Ph.D. dissertation, Univ. of Manitoba, Winnipeg, Canada, 1987.
-
(1987)
Parallel computation of nondeterministic algorithms in VLSI
-
-
Hortensius, P.D.1
-
12
-
-
0004112038
-
-
Reading, MA: Addison-Wesley
-
R. Sedgewick, Algorithms. Reading, MA: Addison-Wesley, 1983.
-
(1983)
Algorithms.
-
-
Sedgewick, R.1
-
13
-
-
0020496768
-
Design for testability-A survey
-
T.W. Williams and K.P. Parker, “Design for testability-A survey,” Proc. IEEE, vol. 71, pp. 98–112, 1983.
-
(1983)
Proc. IEEE
, vol.71
, pp. 98-112
-
-
Williams, T.W.1
Parker, K.P.2
-
14
-
-
0141637909
-
A very fast shift-register sequence random number generator
-
S. Kirkpatrick and E.P. Stoll, “A very fast shift-register sequence random number generator,” J. Comput. Phys., vol. 40, pp. 517–526. 1981.
-
(1981)
J. Comput. Phys.
, vol.40
, pp. 517-526
-
-
Kirkpatrick, S.1
Stoll, E.P.2
-
15
-
-
0021606781
-
Parallel pseudorandom sequences for built-in test
-
P.H. Bardell and W.H. McAnney, “Parallel pseudorandom sequences for built-in test,” 1984 Int. Test Conf., pp. 302–308, 1984.
-
(1984)
1984 Int. Test Conf.
, pp. 302-308
-
-
Bardell, P.H.1
McAnney, W.H.2
-
17
-
-
35949018560
-
Statistical mechanics of cellular automata
-
S. Wolfram, “Statistical mechanics of cellular automata,” Rev. Modern Phys., vol. 55, pp. 601–644, 1983.
-
(1983)
Rev. Modern Phys.
, vol.55
, pp. 601-644
-
-
Wolfram, S.1
-
18
-
-
0020495993
-
University and complexity in cellular automata
-
S. Wolfram, “University and complexity in cellular automata,” Physica, vol. 10D, pp. 1–35, 1984.
-
(1984)
Physica
, vol.10 D
, pp. 1-35
-
-
Wolfram, S.1
-
19
-
-
0006747191
-
Origins of randomness in physical systems
-
S. Wolfram, “Origins of randomness in physical systems,” Phys. Rev. Lett., vol. 55, pp. 449–452, 1985.
-
(1985)
Phys. Rev. Lett.
, vol.55
, pp. 449-452
-
-
Wolfram, S.1
-
20
-
-
46149128523
-
Random sequence generation by cellular automata
-
S. Wolfram, “Random sequence generation by cellular automata,” Advances Appl. Math., vol. 7, pp. 127–169, 1986.
-
(1986)
Advances Appl. Math.
, vol.7
, pp. 127-169
-
-
Wolfram, S.1
-
21
-
-
0022895656
-
Group properties of cellular automata and VLSI applications
-
Dec.
-
W. Pries, A. Thanailakis, and H.C. Card, “Group properties of cellular automata and VLSI applications,” IEEE Trans. Comput., vol. C-35, pp. 1013–1024, Dec. 1986.
-
(1986)
IEEE Trans. Comput.
, vol.35 C
, pp. 1013-1024
-
-
Pries, W.1
Thanailakis, A.2
Card, H.C.3
-
22
-
-
84941536721
-
Weighted test pattern generation for built-in self-test using cellular automata
-
Oct.
-
B.W. Podaima and R.D. McLeod, “Weighted test pattern generation for built-in self-test using cellular automata,” in Third Tech. Workshop, New Directions for 1C Testing, pp. 195–205, Oct. 1985.
-
(1985)
Third Tech. Workshop, New Directions for 1C Testing
, pp. 195-205
-
-
Podaima, B.W.1
McLeod, R.D.2
-
24
-
-
0023314406
-
Pseudorandom testing
-
Mar.
-
K.D. Wagner, C.K. Chin, and E.J. McCluskey, “Pseudorandom testing,” IEEE Trans. Comput., vol. C-36, pp. 332–343, Mar. 1987.
-
(1987)
IEEE Trans. Comput.
, vol.36 C
, pp. 332-343
-
-
Wagner, K.D.1
Chin, C.K.2
McCluskey, E.J.3
-
25
-
-
0024125931
-
Multiple distributions for biased random test patterns
-
H.-J. Wunderlich, “Multiple distributions for biased random test patterns,” in 1988 IEEE Int. Test Conf., pp. 236–244, 1988.
-
(1988)
1988 IEEE Int. Test Conf.
, pp. 236-244
-
-
Wunderlich, H.J.1
-
26
-
-
0016535251
-
The weighted random test-Pattern Generator
-
July
-
H.D. Schnurmann, E. Lindbloom, and R.G. Carpenter, “The weighted random test-Pattern Generator,” IEEE Trans. Comput., vol. C-24, pp. 695–700, July 1975.
-
(1975)
IEEE Trans. Comput.
, vol.24 C
, pp. 695-700
-
-
Schnurmann, H.D.1
Lindbloom, E.2
Carpenter, R.G.3
-
27
-
-
84882546226
-
-
Center Reliable Computing Tech. Rep. No. 84–7, Stanford University, Stanford, CA
-
C.K. Chin and E.J. McCluskey, “Weighted pattern generation for built-in self-test,” Center Reliable Computing Tech. Rep. No. 84–7, Stanford University, Stanford, CA, 1984.
-
(1984)
Weighted pattern generation for built-in self-test
-
-
Chin, C.K.1
McCluskey, E.J.2
-
28
-
-
0023151252
-
?T complexity measures for VLSI computations in constant chip area
-
Jan.
-
H.C. Card, P.G. Gulak, R.D. McLeod, and W. Pries, “?T complexity measures for VLSI computations in constant chip area,” IEEE Trans. Comput., vol. C-36, pp. 112–117, Jan. 1987.
-
(1987)
IEEE Trans. Comput.
, vol.36 C
, pp. 112-117
-
-
Card, H.C.1
Gulak, P.G.2
McLeod, R.D.3
Pries, W.4
-
30
-
-
84941530828
-
Linear cellular automata and LFSR's are isomorphic
-
Oct.
-
M. Serra, D.M. Miller, and J.C. Muzio. “Linear cellular automata and LFSR's are isomorphic,” Third Tech. Workshop, New Directions 1C Testing, pp. 195–205, Oct. 1988.
-
(1988)
Third Tech. Workshop, New Directions 1C Testing
, pp. 195-205
-
-
Serra, M.1
Miller, D.M.2
Muzio, J.C.3
|