Cellular automata based self-test for programmable data paths

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 769-778

  van Sas, Jos ^a   Catthoor, Francky ^a   De Man, Hugo ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER PROGRAMMING; MICROPROCESSOR CHIPS--TESTING;

BUILT IN SELF TEST (BIST) STRATEGY; CELLULAR AUTOMATA; LINEAR FEEDBACK SHIFT REGISTER (LFSR); SOFTWARE PACKAGE CAST;

INTEGRATED CIRCUIT TESTING;

EID: 0025480910     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)