Test pattern embedding in sequential circuits through cellular automata

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 1995, Pages 699-704

  Fummi, F ^a   Sciuto, D ^a   Serra, M ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATA THEORY; BOOLEAN FUNCTIONS; CELLULAR ARRAYS; COMPUTER AIDED DESIGN; CONSTRAINT THEORY; ELECTRIC NETWORK SYNTHESIS; MATHEMATICAL MODELS; PARALLEL PROCESSING SYSTEMS; SEQUENTIAL CIRCUITS; VECTORS;

CELLULAR AUTOMATA; INPUT REGISTER; RESPONSE ANALYZER; SEQUENTIAL TEST GENERATION; TEST PATTERN EMBEDDING;

INTEGRATED CIRCUIT TESTING;

EID: 0029511110     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)