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Volumn , Issue , 1993, Pages 518-521
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Modelling of operating point non linear dependence of Ids characteristics from pulsed measurements in MESFET transistors
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
MESFET DEVICES;
NONLINEAR EQUATIONS;
TRANSISTORS;
INPUT AND OUTPUTS;
MEASUREMENTS OF;
MESFET TRANSISTORS;
NONLINEAR MICROWAVES;
NONLINEAR SOURCE;
OPERATING POINTS;
PACKAGED TRANSISTORS;
PULSED MEASUREMENTS;
COMPUTER AIDED DESIGN;
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EID: 84937657293
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EUMA.1993.336612 Document Type: Conference Paper |
Times cited : (16)
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References (7)
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