New applications for pulsed/isothermal test system

47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996

Volumn , Issue , 1996, Pages 70-75

  Scott, Jonathan ^a   Parker, Anthony ^b   Rathmell, James ^a   Sayed, Mohamed ^c  

^a UNIVERSITY OF SYDNEY   (Australia)

^b MACQUARIE UNIVERSITY   (Australia)

^c Hewlett Packard Lightwave Division   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH POWER; NEW APPLICATIONS; OFF-THE-SHELF MODULES; PRECISE MEASUREMENTS; PRODUCTION LINE; SEMICONDUCTOR PARAMETERS; TEST SYSTEMS; TESTING ENVIRONMENT;

EID: 33747253547     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1996.327166     Document Type: Conference Paper

References (12)

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