Cost/benefit analysis of the P1149.4 mixed-signal test bus

IEE Proceedings: Circuits, Devices and Systems

Volumn 143, Issue 6, 1996, Pages 393-398

  Sunter, S K ^a  

^a LogicVision Canada Inc   (Canada)

Author keywords

Automatic testing; IC testing; Mixed signal test bus

Indexed keywords

AUTOMATIC TESTING; CAPACITANCE MEASUREMENT; COST EFFECTIVENESS; DELAY CIRCUITS; ELECTRIC RESISTANCE MEASUREMENT; MIXER CIRCUITS; STANDARDS;

MIXED SIGNALS TEST BUS;

INTEGRATED CIRCUIT TESTING;

EID: 0030392816     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:19960899     Document Type: Article

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