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Volumn , Issue , 1989, Pages
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IEEE-1149.1 use in design for verification and testability at Texas Instruments
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONICS ENGINEERING--STANDARDS;
APPLICATION-SPECIFIC INTEGRATED CIRCUIT (ASIC);
DESIGN-FOR-TESTABILITY;
IEEE-1149.1;
INTEGRATED CIRCUITS, VLSI;
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EID: 0024924663
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (9)
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