Demonstration IC for the P1149.4 mixed signal test standard

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 92-98

  Lofstrom, Keith ^a  

^a KLIC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; INTEGRATED CIRCUIT LAYOUT; STANDARDS;

MIXED SIGNAL BOUNDARY SCAN;

INTEGRATED CIRCUIT TESTING;

EID: 0030404036     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)