Control and observation of analog nodes in mixed-signal boards

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 323-331

  Matos, Jose S ^a   Leao, Ana C ^a   Ferreira, Joao C ^a  

^a UNIVERSITY OF PORTO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; PRINTED CIRCUIT BOARDS; STANDARDS;

ANALOG NODES; ANALOG TO BOUNDARY SCAN INTERFACE (ABSINT); IEEE 1149.1 STANDARD; INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE); MIXED SIGNAL BOARDS;

PRINTED CIRCUIT TESTING;

EID: 0027870144     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)