Analog fault diagnosis based on ramping power supply current signature clusters

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 43, Issue 10, 1996, Pages 703-712

  Somayajula, Shyam S ^a   Sänchez Sinencio, Edgar ^b   Pineda De Gyvez, José ^b  

^a Texas A M University   (United States)

^b Cirrus Logic   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DETECTOR CIRCUITS; DIGITAL CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FAULT CURRENTS; NEURAL NETWORKS; OPERATIONAL AMPLIFIERS; TRANSISTORS;

ANALOG CIRCUITS; ANALOG FAULTS; KOHONEN NEURAL NETWORK CLASSIFIER; POWER SUPPLY CURRENT SIGNATURE CLUSTERS; RAMP SIGNAL;

POWER SUPPLY CIRCUITS;

EID: 0030261066     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.539002     Document Type: Article

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