Built-in current testing - feasibility study

Volumn , Issue , 1988, Pages 340-343

  Maly, Wojciech ^a   Nigh, Phil ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING--RELIABILITY; SEMICONDUCTOR DEVICES, MOS; SENSORS;

ABNORMAL CURRENTS; BUILT-IN-CURRENT TESTING; CMOS IC; CURRENT SENSORS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024167571     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)