In-circuit electro-optic field mapping for function test and characterization of MMICs

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1533-1536

  David, G ^a   Tempel, R ^a   Wolff, I ^a   Jaeger, D ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER AIDED NETWORK ANALYSIS; ELECTRIC FIELD MEASUREMENT; ELECTROOPTICAL EFFECTS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING;

HIGH FREQUENCY CIRCUIT CHARACTERIZATION; TWO DIMENSIONAL ELECTROOPTIC MAPPING;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0029713716     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)