Simple electric near field probe for microwave circuit diagnostics

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1537-1540

  Gao, Yingjie ^a   Wolff, Ingo ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; POWER AMPLIFIERS; PROBES;

ELECTRIC NEAR FIELD PROBE;

MICROWAVE CIRCUITS;

EID: 0029703312     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)