Laser-Diode Based Scanning Force Microscope and Ultrafast Sampling Probe

Optics InfoBase Conference Papers

Volumn , Issue , 1995, Pages 172-174

  Nees, John ^a   Craig, Douglas ^a   Hama, Soichi ^b   Wakana, Shinichi ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85135894825     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. D. R. Grischkowsky, et al IEEE J. Quantum Electron. QE-24, 221 (1988)
2. J. Kim, S. Williamson, J. Nees, S. Wakana, and J. Whitaker, Appl. Phys. Lett. 62 (18), 3 May 1993.
3. C.A. Spindt, L. Brodie, L. Humpfrey, and E. R. E. R. Westerberg, J. Appl. Phys. 47, 5248 (1976).