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Volumn 40, Issue 8-10, 2000, Pages 1285-1294

Design for reliability

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EID: 0012835501     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00138-4     Document Type: Article
Times cited : (13)

References (10)
  • 2
    • 0032187029 scopus 로고    scopus 로고
    • Downsizing of silicon MOSFETs beyond 0.1μm
    • Iwai H. Downsizing of silicon MOSFETs beyond 0.1μm. Microelec. J. 29 (1998) 671-678.
    • (1998) Microelec. J. , vol.29 , pp. 671-678
    • Iwai, H.1
  • 3
    • 0032679692 scopus 로고    scopus 로고
    • Silicon nanoelectronics for the 21st century
    • Hu C. Silicon nanoelectronics for the 21st century. Nanotech. 10 (1999) 113-116.
    • (1999) Nanotech. , vol.10 , pp. 113-116
    • Hu, C.1
  • 4
    • 0033115380 scopus 로고    scopus 로고
    • Nanoscale CMOS
    • Wong H-SP et al. Nanoscale CMOS. Proc. IEEE 87 (1999) 537-570.
    • (1999) Proc. IEEE , vol.87 , pp. 537-570
    • Wong, H.-S.P.1
  • 5
    • 0032592096 scopus 로고    scopus 로고
    • Design challenges of technology scaling
    • Borkar S. Design challenges of technology scaling. IEEE Micro. 19 (1999) 23-29.
    • (1999) IEEE Micro , vol.19 , pp. 23-29
    • Borkar, S.1
  • 6
    • 0029276032 scopus 로고
    • VLSI Reliability Challenges: From device physics to wafer scale systems
    • Takeda E et al. VLSI Reliability Challenges: from device physics to wafer scale systems. Microelec. Reliab. 35 (1995) 325-363.
    • (1995) Microelec. Reliab. , vol.35 , pp. 325-363
    • Takeda, E.1
  • 7
    • 0030197282 scopus 로고    scopus 로고
    • Reliability challenges for low voltage/low power integrated circuits
    • Galbraith JM et al. Reliability challenges for low voltage/low power integrated circuits. Qual. and Reliab. Eng. Intl. (1996) 271-279.
    • (1996) Qual. and Reliab. Eng. Intl. , pp. 271-279
    • Galbraith, J.M.1
  • 8
    • 0030871507 scopus 로고    scopus 로고
    • Scaling down and reliability problems of gigabit CMOS circuits
    • Krautschneider WH et al. Scaling down and reliability problems of gigabit CMOS circuits. Microelec. Reliab. 37 (1997) 19-37.
    • (1997) Microelec. Reliab. , vol.37 , pp. 19-37
    • Krautschneider, W.H.1
  • 9
    • 0031191443 scopus 로고    scopus 로고
    • Challenges for giga-scale integration
    • Takeda E. Challenges for giga-scale integration. Microelec. Reliab. 37 (1997) 985-1001.
    • (1997) Microelec. Reliab. , vol.37 , pp. 985-1001
    • Takeda, E.1
  • 10
    • 0033225409 scopus 로고    scopus 로고
    • Test Challenges in Nanometric CMOS Technologies
    • Figueras J et al. Test Challenges in Nanometric CMOS Technologies. Microelec. Eng. 49 (1999) 119-133.
    • (1999) Microelec. Eng. , vol.49 , pp. 119-133
    • Figueras, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.