SCOPUS 정보 검색 플랫폼

Volumn 40, Issue 8-10, 2000, Pages 1285-1294

Design for reliability

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012835501 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(00)00138-4 Document Type: Article

Times cited : (14)

References (10)

1
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- Semiconductor Industry Association (SIA). International Technology Roadmap for Semiconductors (1999) available at www.sematech.org
- International Technology Roadmap for Semiconductors (1999)

2
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- Downsizing of silicon MOSFETs beyond 0.1μm
- Iwai H. Downsizing of silicon MOSFETs beyond 0.1μm. Microelec. J. 29 (1998) 671-678.
- (1998) Microelec. J. , vol.29 , pp. 671-678
- Iwai, H.¹

3
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- Silicon nanoelectronics for the 21st century
- Hu C. Silicon nanoelectronics for the 21st century. Nanotech. 10 (1999) 113-116.
- (1999) Nanotech. , vol.10 , pp. 113-116
- Hu, C.¹

4
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- Nanoscale CMOS
- Wong H-SP et al. Nanoscale CMOS. Proc. IEEE 87 (1999) 537-570.
- (1999) Proc. IEEE , vol.87 , pp. 537-570
- Wong, H.-S.P.¹

5
- 0032592096
- Design challenges of technology scaling
- Borkar S. Design challenges of technology scaling. IEEE Micro. 19 (1999) 23-29.
- (1999) IEEE Micro , vol.19 , pp. 23-29
- Borkar, S.¹

6
- 0029276032
- VLSI Reliability Challenges: From device physics to wafer scale systems
- Takeda E et al. VLSI Reliability Challenges: from device physics to wafer scale systems. Microelec. Reliab. 35 (1995) 325-363.
- (1995) Microelec. Reliab. , vol.35 , pp. 325-363
- Takeda, E.¹

7
- 0030197282
- Reliability challenges for low voltage/low power integrated circuits
- Galbraith JM et al. Reliability challenges for low voltage/low power integrated circuits. Qual. and Reliab. Eng. Intl. (1996) 271-279.
- (1996) Qual. and Reliab. Eng. Intl. , pp. 271-279
- Galbraith, J.M.¹

8
- 0030871507
- Scaling down and reliability problems of gigabit CMOS circuits
- Krautschneider WH et al. Scaling down and reliability problems of gigabit CMOS circuits. Microelec. Reliab. 37 (1997) 19-37.
- (1997) Microelec. Reliab. , vol.37 , pp. 19-37
- Krautschneider, W.H.¹

9
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- Challenges for giga-scale integration
- Takeda E. Challenges for giga-scale integration. Microelec. Reliab. 37 (1997) 985-1001.
- (1997) Microelec. Reliab. , vol.37 , pp. 985-1001
- Takeda, E.¹

10
- 0033225409
- Test Challenges in Nanometric CMOS Technologies
- Figueras J et al. Test Challenges in Nanometric CMOS Technologies. Microelec. Eng. 49 (1999) 119-133.
- (1999) Microelec. Eng. , vol.49 , pp. 119-133
- Figueras, J.¹

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