Reliability challenges for low voltage/low power integrated circuits

Quality and Reliability Engineering International

Volumn 12, Issue 4, 1996, Pages 271-279

  Galbraith, J M ^a   Galloway, K F ^a   Schrimpf, R D ^a   Johnson, G H ^a  

^a University of Arizona   (United States)

Author keywords

Integrated circuits; Low power; Low voltage; Microelectronics; Reliability; Semiconductor devices; Semiconductor technology

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC LOSSES; ELECTRIC POWER SUPPLIES TO APPARATUS; GATES (TRANSISTOR); INTEGRATED CIRCUITS; MICROELECTRONICS; RELIABILITY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; SILICON ON INSULATOR TECHNOLOGY;

GATE OXIDES; LOW VOLTAGE LOW POWER INTEGRATED CIRCUITS; SEMICONDUCTOR TECHNOLOGY;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0030197282     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199607)12:4<271::AID-QRE30>3.0.CO;2-Q     Document Type: Article

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