-
1
-
-
0030960642
-
-
K. Vanheusden, W. L. Warren, D. M. Fleetwood, J. R. Schwank, M. R. Shaneyfelt, P. S. Winokur, R. A. B. Devine, and Z. J. Lemnios, Nature (London) 386, 587 (1997).
-
(1997)
Nature (London)
, vol.386
, pp. 587
-
-
Vanheusden, K.1
Warren, W.L.2
Fleetwood, D.M.3
Schwank, J.R.4
Shaneyfelt, M.R.5
Winokur, P.S.6
Devine, R.A.B.7
Lemnios, Z.J.8
-
3
-
-
0031375376
-
-
W. L. Warren, D. M. Fleetwood, J. R. Schwank, M. R. Shaneyfelt, B. L. Draper, P. S. Winokur, M. G. Knoll, K. Vanheusden, R. A. B. Devine, L. B. Archer, and R. M. Wallace, IEEE Trans. Nucl. Sci. 44, 1789 (1997).
-
(1997)
IEEE Trans. Nucl. Sci.
, vol.44
, pp. 1789
-
-
Warren, W.L.1
Fleetwood, D.M.2
Schwank, J.R.3
Shaneyfelt, M.R.4
Draper, B.L.5
Winokur, P.S.6
Knoll, M.G.7
Vanheusden, K.8
Devine, R.A.B.9
Archer, L.B.10
Wallace, R.M.11
-
4
-
-
0032305989
-
-
S. P. Karna, R. D. Pugh, J. R. Chavez, W. Shedd, C. P. Brothers, B. K. Singaraju, M. Vitiello, G. Pacchioni, and R. A. B. Devine, IEEE Trans. Nucl. Sci. NS-45, 2408 (1998).
-
(1998)
IEEE Trans. Nucl. Sci.
, vol.NS-45
, pp. 2408
-
-
Karna, S.P.1
Pugh, R.D.2
Chavez, J.R.3
Shedd, W.4
Brothers, C.P.5
Singaraju, B.K.6
Vitiello, M.7
Pacchioni, G.8
Devine, R.A.B.9
-
7
-
-
0033190241
-
-
K. Vanheusden, D. M. Fleetwood, R. A. B. Devine, and W. L. Warren, Microelectron. Eng. 48, 363 (1999).
-
(1999)
Microelectron. Eng.
, vol.48
, pp. 363
-
-
Vanheusden, K.1
Fleetwood, D.M.2
Devine, R.A.B.3
Warren, W.L.4
-
8
-
-
0002868599
-
-
K. Vanheusden, W. L. Warren, D. M. Fleetwood, J. R. Schwank, M. R. Shaneyfelt, B. L. Draper, P. S. Winokur, R. A. B. Devine, L. B. Archer. G. A. Brown, and R. M. Wallace, Appl. Phys. Lett. 73, 674 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 674
-
-
Vanheusden, K.1
Warren, W.L.2
Fleetwood, D.M.3
Schwank, J.R.4
Shaneyfelt, M.R.5
Draper, B.L.6
Winokur, P.S.7
Devine, R.A.B.8
Archer, L.B.9
Brown, G.A.10
Wallace, R.M.11
-
9
-
-
0001048569
-
-
S. M. Myers, G. A. Brown, A. G. Revesz, and H. L. Hughes, J. Appl. Phys. 73, 2196 (1993).
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 2196
-
-
Myers, S.M.1
Brown, G.A.2
Revesz, A.G.3
Hughes, H.L.4
-
12
-
-
0004047079
-
-
Kluwer, Boston, MA
-
S. Cristoloveanu and S. S. Li, in Electrical Characterization of Silicon-on-Insulator Materials and Devices (Kluwer, Boston, MA, 1995), p. 15.
-
(1995)
Electrical Characterization of Silicon-on-insulator Materials and Devices
, pp. 15
-
-
Cristoloveanu, S.1
Li, S.S.2
-
13
-
-
21544478697
-
-
R. A. B. Devine, D. Mathiot, W. L. Warren, D. M. Fleetwood, and B. Aspar. Appl. Phys. Lett. 63, 2926 (1993).
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 2926
-
-
Devine, R.A.B.1
Mathiot, D.2
Warren, W.L.3
Fleetwood, D.M.4
Aspar, B.5
-
15
-
-
0030647842
-
-
edited by W. L. Warren, R. A. B. Devine, M. Matsumura, S. Cristoloveanu, Y. Homma, and J. Kanicki Materials Research Society. Pittsburgh, PA
-
K. Vanheusden, W. L. Warren, R. A. B. Devine, D. M. Fleetwood, J. R. Schwank, P. S. Winokur, and Z. J. Lemnios, in Amorphous and Crystalline Insulating Thin Films, edited by W. L. Warren, R. A. B. Devine, M. Matsumura, S. Cristoloveanu, Y. Homma, and J. Kanicki (Materials Research Society. Pittsburgh, PA, 1997), Vol. 446, p. 187.
-
(1997)
Amorphous and Crystalline Insulating Thin Films
, vol.446
, pp. 187
-
-
Vanheusden, K.1
Warren, W.L.2
Devine, R.A.B.3
Fleetwood, D.M.4
Schwank, J.R.5
Winokur, P.S.6
Lemnios, Z.J.7
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