Chapter 5 Scanning Tunneling Microscopy of Defects in Semiconductors

Semiconductors and Semimetals

Volumn 51, Issue PART B, 1999, Pages 261-296

  Jäger, Nikos D ^a   Weber, Eicke R ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS IN SEMICONDUCTORS;

SCANNING TUNNELING MICROSCOPY;

EID: 0007671694     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62978-6     Document Type: Article

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