Charge injection and stm-induced vacancy migration on GaAs(110)

Physical Review Letters

Volumn 76, Issue 25, 1996, Pages 4725-4728

  Lengel, G ^a   Harper, J ^a   Weimer, M ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000863426     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.4725     Document Type: Article

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