Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As vacancies on GaAs (110)

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 11, 1996, Pages 6935-6938

  Chao, Kuo Jen ^a   Smith, Arthur R ^a   Shih, Chih Kang ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000404355     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.6935     Document Type: Article

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