Metastable hydrogen atom trapping in hydrogenated amorphous silicon films: A microscopic model for metastable defect creation

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 77, Issue 3, 1998, Pages 765-777

  Godet, C ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006812752     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819808214833     Document Type: Article

References (29)

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