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Volumn 198-200, Issue PART 1, 1996, Pages 482-485
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Density of states and photoconductivity light degradation in a-Si:H at different temperatures
a
ENEA CR Portici
(Italy)
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
DEFECTS;
DEGRADATION;
ELECTRONIC DENSITY OF STATES;
ENERGY GAP;
LIGHT;
MATHEMATICAL MODELS;
PHOTOCONDUCTIVITY;
THERMAL EFFECTS;
LIGHT DEGRADATION PROCESS;
RECOMBINATION INDUCED BOND BREAKING MODEL;
STRETCHED EXPONENTIAL MODEL;
AMORPHOUS SILICON;
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EID: 0030563399
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00746-6 Document Type: Article |
Times cited : (6)
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References (7)
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