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Volumn 198-200, Issue PART 1, 1996, Pages 46-51

Hydrogen-induced defects in polycrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRONIC DENSITY OF STATES; GRAIN BOUNDARIES; HYDROGEN; POLYCRYSTALLINE MATERIALS;

EID: 0030563542     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00653-2     Document Type: Article
Times cited : (7)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.