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Volumn 38, Issue 2 A, 1999, Pages 635-644

Drastic improvement in surface flatness properties by using GaAs (111)a substrates in molecular beam epitaxy

Author keywords

(111)A; Dislocations; Fermi level pinning; GaAs; Hot electron ransistors; In situ observation; InAs; Scanning electron microscopy; Surface flatness; Two dimensional electron systems

Indexed keywords


EID: 0005792621     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.635     Document Type: Article
Times cited : (19)

References (72)
  • 62
    • 0003748504 scopus 로고
    • John Wiley & Sons, New York, and references therein
    • High-Speed Semiconductor Devices, cd. S. M. Sze (John Wiley & Sons, New York, 1990) and references therein.
    • (1990) High-Speed Semiconductor Devices
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.