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Volumn 55, Issue 3, 1997, Pages 1337-1340

Atomic-scale imaging of strain relaxation via misfit dislocations in highly mismatched semiconductor heteroepitaxy: InAs/GaAs(111)A

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EID: 0000504608     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.1337     Document Type: Article
Times cited : (138)

References (18)
  • 1
    • 21144463387 scopus 로고
    • D.W. Pashley, Philos. Mag. A 67, 1333 (1993).
    • (1993) Philos. Mag. A , vol.67 , pp. 1333


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.