Effects of InGaP heteropassivation on reliability of GaAs HBTs

Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1817-1822

  Song, Chung Kun ^a   Choi, Pun Jae ^a  

^a Dong A University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004631496     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00190-0     Document Type: Article

References (17)

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