Degradation of AlGaAs/GaAs HBTs induced by hot carriers

Microelectronics Reliability

Volumn 38, Issue 12, 1998, Pages 1907-1912

  Song, Chung Kun ^a   Kim, Duk Young ^a   Choi, Pun Jae ^a   Choi, Jae Hoon ^a   Kim, Do Hyun ^a  

^a Dong A University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; ELECTRIC CURRENTS; ETCHING; HOT CARRIERS; PASSIVATION; RELIABILITY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR JUNCTIONS; SILICON NITRIDE;

ELECTRICAL STRESS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0032314982     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00187-5     Document Type: Article

References (9)

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