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Volumn 253, Issue 1-2, 1998, Pages 8-15

Ion implantation of semiconductors

Author keywords

Compound semiconductors; Ion implantation; Radiation damage; Semiconductors; Silicon processing

Indexed keywords

COMPOUND SEMICONDUCTORS; ION BEAM MODIFICATION; RESIDUAL IMPLANTATION INDUCED DEFECTS; SILICON PROCESSING;

EID: 0002490765     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(98)00705-9     Document Type: Article
Times cited : (209)

References (59)
  • 16
    • 0000542038 scopus 로고
    • Radiation effects in semiconductors
    • N.B. Urli, J.W. Corbett (Eds.), Institute of Physics, Bristol
    • L.C. Kimerling, in: N.B. Urli, J.W. Corbett (Eds.), Radiation Effects in Semiconductors, 1976, IOP Conf. Proc. No. 31, Institute of Physics, Bristol, 1977, pp. 221.
    • (1976) IOP Conf. Proc. No. 31 , vol.31 , pp. 221
    • Kimerling, L.C.1
  • 26
    • 85162598263 scopus 로고
    • PhD Thesis, Melbourne University
    • R.D. Goldberg, PhD Thesis, Melbourne University, 1995.
    • (1995)
    • Goldberg, R.D.1
  • 54
    • 85162584585 scopus 로고    scopus 로고
    • private communication
    • W. Frank, private communication.
    • Frank, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.