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Volumn 132, Issue 2-4, 2000, Pages 225-236

Quantitative AES-mapping and depth profiling

Author keywords

Auger; Depth profiling; Microscopy; Surface analysis

Indexed keywords


EID: 0001569071     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (50)
  • 22
    • 24944578500 scopus 로고
    • D. F. Kyser, H. Niedrig, D. E. Newbury and R. Shimizu (Eds.) SEM, Chicago, Monterey
    • H. E. Bishop, in Electron Beam Interactions with Solids. In: D. F. Kyser, H. Niedrig, D. E. Newbury and R. Shimizu (Eds.) SEM, Chicago, Monterey, 1984, p. 259.
    • (1984) Electron Beam Interactions with Solids , pp. 259
    • Bishop, H.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.