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Volumn 63, Issue 3-4, 1996, Pages 193-203

Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; INTERFACES (MATERIALS); STATISTICAL METHODS; SURFACE STRUCTURE;

EID: 0030198694     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00039-3     Document Type: Article
Times cited : (18)

References (19)
  • 19
    • 0011825359 scopus 로고
    • Ph.D. Thesis (University of York)
    • [19] J.M. Walton, Ph.D. Thesis (University of York) (1994).
    • (1994)
    • Walton, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.