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Volumn 63, Issue 3-4, 1996, Pages 193-203
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Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
IMAGE ANALYSIS;
INTERFACES (MATERIALS);
STATISTICAL METHODS;
SURFACE STRUCTURE;
PRINCIPAL COMPONENT ANALYSIS;
SURFACE TOPOGRAPHY;
THREE DIMENSIONAL SCATTER DIAGRAMS;
MICROANALYSIS;
ARTICLE;
CATALYST;
ELECTRON MICROSCOPY;
IMAGING;
MICROANALYSIS;
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EID: 0030198694
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(96)00039-3 Document Type: Article |
Times cited : (18)
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References (19)
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