SCOPUS 정보 검색 플랫폼

Volumn 32, Issue 3, 1988, Pages 320-331

Scanning Low Energy Electron Loss Microscopy (SLEELM): Au on Si

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION - SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY, ELECTRON; SURFACES - SPECTROSCOPIC ANALYSIS;

ELECTRON LOSS IMAGING; LOW-ENERGY ELECTRON LOSS MICROSCOPY; METAL/SEMICONDUCTOR DEVICES;

SEMICONDUCTOR DEVICES;

EID: 0024048404 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/0169-4332(88)90017-7 Document Type: Article

Times cited : (8)

References (19)

1
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- SEM, AMF O'Hare, Chicago, IL
- (1974) Scanning Electron Microscopy/1974 , pp. 1
- Wells¹

4
- 84914319468
- SEM, AMF O'Hare, Chicago, IL
- (1985) Scanning Electron Microscopy IV/1985 , pp. 1449
- Bevolo¹

5
- 84985222610
- Scanning low energy electron loss microscopy (SLEELM)
- (1987) Journal of Microscopy , vol.147 , Issue.2 , pp. 137
- El Gomati¹ Matthew²

8
- 84915275137
- M.M. El Gomati and C.G.H. Walker, Appl. Surface Sci., submitted.

9
- 0020498760
- (1983) J. Appl. Phys. , vol.54 , pp. 374
- Prutton¹ Larson² Poppa³

11
- 0010658052
- Slow electron-energy-loss spectroscopy for surface microanalysis
- (1985) Surface Science , vol.149 , pp. 313
- Nassiopoulous¹ Cazaux²

14
- 0000617687
- Monte Carlo calculations of the spatial resolution in a scanning auger electron microscope
- (1979) Surface Science , vol.72 , pp. 485
- El Gomati¹ Prutton²

16
- 0004571573
- Theoretical electron scattering amplitudes and spin polarizations
- (1970) Atomic Data and Nuclear Data Tables , vol.1 , pp. 385
- Fink¹ Yates²

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