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Volumn 50, Issue 3-4, 1998, Pages 473-479

Resolution correction in EELS

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON SCATTERING; ELECTRONS; SPECTROMETERS;

EID: 0032108783     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00082-7     Document Type: Article
Times cited : (8)

References (21)
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    • Yubero, F.1    Sanz, J.M.2    Ramskov, B.3    Tougaard, S.4
  • 4
    • 0001712176 scopus 로고
    • Tougaard, S. and Kraaer, J., Phys. Rev., 1991, B43, 1651 ; Yubero, F., Sanz, J. M., Ramskov, B. and Tougaard, S., ibid., 1991, B53, 9719 ; Yubero, F., Fujita, D., Ramskov, B. and Tougaard, S., ibid., 1991, B53, 9728 ; Tougaard, S., Surf. and Interface Anal., 1997, 25, 137; Chorkendorff, I. and Tougaard, S., Appl. Surf. Sci., 1987, 29, 101.
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