Determination of frontier orbital alignment and band bending at an organic semiconductor heterointerface by combined x-ray and ultraviolet photoemission measurements

Applied Physics Letters

Volumn 73, Issue 8, 1998, Pages 1026-1028

  Schlaf, R ^a   Parkinson, B A ^a   Lee, P A ^b   Nebesny, K W ^b   Armstrong, N R ^b  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000507552     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122073     Document Type: Article

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