Lead zirconate titanate cantilever for noncontact atomic force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 428-431

  Miyahara, Y ^a   Fujii, T ^a,b   Watanabe, S ^b   Tonoli, A ^c   Carabelli, S ^c   Yamada, H ^d   Bleuler, H ^a  

^a EPFL   (Switzerland)

^b NIKON CORPORATION   (Japan)

^c POLITECNICO DI TORINO   (Italy)

^d KYOTO UNIVERSITY   (Japan)

Author keywords

61.16.Ch; 77.55.+f; 77.65.Fs; 77.84.Dy; APN; Atomic force microscopy; Frequency modulation technique; Lead zirconate titanate; Noncontact mode; Piezoelectric cantilever; True atomic resolution

Indexed keywords

EID: 0001407875     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00567-4     Document Type: Article

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