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Volumn 77, Issue 23, 2000, Pages 3845-3847

Sensitivity of a micromechanical displacement detector based on the radio-frequency single-electron transistor

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001378517     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1331090     Document Type: Article
Times cited : (94)

References (19)
  • 1
    • 0346882629 scopus 로고    scopus 로고
    • edited by D. Gershoni World Scientific, Singapore
    • A. N. Cleland and M. L. Roukes, in Proceedings ICPS-24, edited by D. Gershoni (World Scientific, Singapore, 1999).
    • (1999) Proceedings ICPS-24
    • Cleland, A.N.1    Roukes, M.L.2
  • 13
    • 0003973069 scopus 로고
    • edited by B. L. Altshuler, P. A. Lee, and R. A. Webb Elsevier, Amsterdam
    • D. V. Averin and K. K. Likharev, in Mesoscopic Phenomena in Solids, edited by B. L. Altshuler, P. A. Lee, and R. A. Webb (Elsevier, Amsterdam, 1991).
    • (1991) Mesoscopic Phenomena in Solids
    • Averin, D.V.1    Likharev, K.K.2
  • 15
    • 85037493093 scopus 로고    scopus 로고
    • note
    • g.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.