Two-step growth of high-quality GaN by hydride vapor-phase epitaxy

Applied Physics Letters

Volumn 77, Issue 12, 2000, Pages 1804-1806

  Tavernier, P R ^a   Etzkorn, E V ^a   Wang, Y ^a   Clarke, D R ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001357670     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1311600     Document Type: Article

References (18)

1. H. P. Maruska and J. J. Tietjen, Appl. Phys. Lett. 15, 327 (1969).
2. W. Seifert, G. Fitzl, and E. Butter, J. Cryst. Growth 52, 257 (1981).
3. H. Amano, N. Sawaki, I. Akasaki, and Y. Toyoda, Appl. Phys. Lett. 48, 353 (1986).
4. S. Nakamura, Jpn. J. Appl. Phys., Part 2 30, L1705 (1991).
5. E. Valcheva, T. Paskova, S. Tungasmita, P. O. A. Persson, J. Birch, E. B. Svedberg, L. Hultman, and B. Monemar, Appl. Phys. Lett. 76, 1860 (2000).
6. J. Lee, H. Pack, J. Yoo, G. Kim, and D. Kum, Mater. Sci. Eng., B B59, 12 (1999).
7. S. Nakamura et al., Appl. Phys. Lett. 72, 2014 (1998).
8. T. Detchprohm, K. Hiramatsu, H. Amano, and I. Akasaki, Appl. Phys. Lett. 61, 2688 (1992).
9. R. J. Molnar, W. Goetz, L. T. Romano, and N. M. Johnson, J. Cryst. Growth 70, 3377 (1997).
10. Y. Golan, X. H. Wu, J. S. Speck, R. P. Vaudo, and V. M. Phanse, Appl. Phys. Lett. 73, 3090 (1998).
11. A similar observation was also made with amorphous ZnO thin films on sapphire using a rapid thermal annealer.
12. V. Srikant, J. S. Speck, and D. R. Clarke, J. Appl. Phys. 82, 4286 (1997).
13. B. Heying, X. H. Wu, S. Keller, Y. Li, D. Kapolnek, B. P. Keller, S. P. DenBaars, and J. S. Speck, Appl. Phys. Lett. 68, 643 (1996).
14. J. E. Ayers, J. Cryst. Growth 135, 71 (1994).
15. P. R. Tavernier, P. M. Verghese, and D. R. Clarke, Appl. Phys. Lett. 74, 2678 (1999).
16. F. C. Frank, Acta Crystallogr. 4, 497 (1951).
17. B. Heying, E. J. Tarsa, C. R. Elsass, P. Fini, S. P. DenBaars, and J. S. Speck, J. Appl. Phys. 85, 6470 (1999).
18. Y. Wang, E. V. Etzkorn, P. Tavernier, and D. R. Clarke (unpublished).