Imaging of dynamic patterns on surfaces

Current Opinion in Solid State and Materials Science

Volumn 3, Issue 4, 1998, Pages 354-360

  Rotermund, Ham Hinrich ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

CCD charge coupled device; EMSI ellipsometry for surface imaging; LEEM low energy electron microscope; PEEM photoemission electron microscopy; RAM reflection anisotropy microscopy; UHV ultrahigh vacuum

Indexed keywords

EID: 0001124701     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(98)80044-2     Document Type: Article

References (54)

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