Ellipsomicroscopy for surface imaging: A novel tool to investigate surface dynamics

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1117-1121

  Haas, G ^a   Pletcher, T D ^a   Bonilla, G ^a   Jachimowski, T A ^a   Rotermund, H H ^b   Lauterbach, J ^a  

^a PURDUE UNIVERSITY   (United States)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001275483     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581243     Document Type: Article

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