Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy

Science

Volumn 267, Issue 5194, 1995, Pages 68-71

  Giessibl, Franz J ^a  

^a Park Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; FEEDBACK; FREQUENCY MODULATION; OPTICAL RESOLVING POWER; SILICON; SURFACES; VAN DER WAALS FORCES;

ATOMIC RESOLUTION; FREQUENCY SHIFT; OSCILLATION AMPLITUDE; PIEZOLEVER;

ATOMIC FORCE MICROSCOPY;

EID: 0029637281     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.267.5194.68     Document Type: Article

References (23)

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5. These tips are called Ultralevers (Park Scientific Instruments, Sunnyvale, CA).
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13. The forces acting between tip and sample during STM operation have been measured by mounting a sample on a CL and monitoring the variation of the oscillation frequency of the sample-CL assembly by fm detection of the tunneling current [U. Dürig, O. Züger, D. W. Pohl, Phys. Rev. Lett. 65, 349 (1990); U. Dürig and O. Züger, Phys. Rev. B 50, 5008 (1994); and references therein].
14. The forces acting between tip and sample during STM operation have been measured by mounting a sample on a CL and monitoring the variation of the oscillation frequency of the sample-CL assembly by fm detection of the tunneling current [U. Dürig, O. Züger, D. W. Pohl, Phys. Rev. Lett. 65, 349 (1990); U. Dürig and O. Züger, Phys. Rev. B 50, 5008 (1994); and references therein].
15. VPPL 40NO (Park Scientific Instruments).
16. The dominant low-frequency noise component in fm detection is the variation of the eigenfrequency of the PL with temperature. This frequency shift is very small for appropriate oscillation amplitudes (70) compared with the frequency shift resulting from the tip-sample interaction and can be neglected.
17. -11 mbar.
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21. This is a very conservative estimate, because Si is a very brittle material, and the actual range of the attractive interatomic potential will be much shorter. For the purpose of this analysis, this estimate is sufficient because the uncertainty in the tip-sample interaction is much larger.
22. 2/2) for × ≪ 1] to equation presented
23. I thank C. F. Quate for his continuous support, B. M. Trafas for sharing his experience of imaging Si(111)-(7×7) using the STM with me, M. D. Kirk for technical discussions and bringing his enthusiasm to this project, S. Yoshikawa for help with sample preparation, J. Nogami for useful comments, and S. Presley for his technical support. M. Tortonese supplied me with PLs and an understanding of how to use them, and T. R. Albrecht shared his knowledge of fm detection with me.