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Volumn 76, Issue 24, 2000, Pages 3561-3563

Initial oxynitridation of a Si(001)-2×1 surface by No

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[No Author keywords available]

Indexed keywords


EID: 0001121321     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126707     Document Type: Article
Times cited : (22)

References (22)
  • 11
    • 0345832809 scopus 로고    scopus 로고
    • Fundamental aspects of ultrathin dielectrics on Si-based devices
    • edited by E. Garfunkel, E. Gvsev, and A. Vull Kluwer, Dordrecht
    • For example: T. Hattori, in Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices, NATO ASI Series, edited by E. Garfunkel, E. Gvsev, and A. Vull (Kluwer, Dordrecht, 1998), p. 241.
    • (1998) NATO ASI Series , pp. 241
    • Hattori, T.1
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.