SCOPUS 정보 검색 플랫폼

Volumn 62, Issue 1-2, 1996, Pages 53-63

Analysis of grain boundary dislocations by large angle convergent beam electron diffraction

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; REFLECTION; SILICON; SINGLE CRYSTALS; VECTORS;

BURGERS VECTORS; DISPLACEMENT SHIFT COMPLETE LATTICE VECTORS; LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION; STANDARD CHERNS-PRESTON RULES;

ELECTRON DIFFRACTION;

ARTICLE; ELECTRON DIFFRACTION; IMAGE ANALYSIS;

EID: 0029896498 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/0304-3991(95)00087-9 Document Type: Article

Times cited : (10)

References (9)

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2
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