In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens

Applied Optics

Volumn 39, Issue 25, 2000, Pages 4690-4697

  Li, Bincheng ^a   Martin, Sven ^a   Welsch, Eberhard ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LASERS; LENSES; THERMAL STRESS; ULTRAVIOLET RADIATION;

THERMAL LENS;

DIELECTRIC MATERIALS;

EID: 0000648095     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.004690     Document Type: Article

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