Investigation of the absorption induced damage in ultraviolet dielectric thin films

Optical Engineering

Volumn 36, Issue 2, 1997, Pages 504-514

  Welsch, Eberhard ^a,d   Ettrich, K ^a   Blaschke, H ^a   Thomsen Schmidt, Peter ^b   Schäfer, Dieter ^b   Kaiser, Norbert ^c  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b Berliner Institut fü Optik   (Germany)

^c Optik und Feinmechanik Jena   (Germany)

^d Inst of Opt and Quant Electronics   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005047475     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601222     Document Type: Article

References (29)

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