Laser-induced surface thermal lensing for thin film characterizations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2714, Issue , 1996, Pages 294-304

  Wu, Zhouling ^a   Kuo, Pao Kuang ^b   Lu, Y S ^b   Gu, S T ^a  

^a EASTERN MICHIGAN UNIVERSITY   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

Author keywords

Optical thin films; Photothermal deformation; Surface thermal lensing; Weak absorption measurement

Indexed keywords

ABSORPTION; CHARACTERIZATION; DEFORMATION; DIFFRACTION; FILMS; LASER DAMAGE; LASERS; MIRRORS; OPTICAL FILTERS; OPTICAL MATERIALS; SOLIDS; SURFACES; THIN FILM DEVICES; THIN FILMS;

ABSORPTION MEASUREMENTS; CONVENTIONAL METHODS; DEFECT CHARACTERIZATIONS; DEFOCUS; DETECTION SCHEMES; FILM CHARACTERIZATIONS; FILM COATINGS; OPTICAL BEAM DEFLECTIONS; OPTICAL DIFFRACTION EFFECTS; OPTICAL DIFFRACTIONS; OPTICAL THIN FILMS; PHOTOTHERMAL DEFORMATION; PROBE LASER BEAMS; REFLECTION MIRRORS; SPECIFIC GEOMETRIES; SURFACE DEFORMATIONS; SURFACE THERMAL LENSING; WEAK ABSORPTION MEASUREMENT;

OPTICAL FILMS;

EID: 57849105536     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.240357     Document Type: Conference Paper

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