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Volumn 88, Issue 7, 2000, Pages 4319-4324

Electroluminescence with high and stable quantum efficiency and low threshold voltage from anodically oxidized thin porous silicon diode

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000635576     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1290458     Document Type: Article
Times cited : (171)

References (17)
  • 2
    • 0000227182 scopus 로고    scopus 로고
    • Properties of porous silicon
    • edited by L. T. Canham INSPEC, The Institution of Electrical Engineers, London
    • T. I. Cox, in Properties of Porous Silicon, EMIS Datareviews Series No. 18, edited by L. T. Canham (INSPEC, The Institution of Electrical Engineers, London, 1997), pp. 290-310.
    • (1997) EMIS Datareviews Series , vol.18 , pp. 290-310
    • Cox, T.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.