Anodic oxidation of p- and p+-type porous silicon: Surface structural transformations and oxide formation

Thin Solid Films

Volumn 276, Issue 1-2, 1996, Pages 76-79

  Cantin, J L ^a   Schoisswohl, M ^a   Grosman, A ^a   Lebib, S ^a   Ortega, C ^a   Von Bardeleben, H J ^a   Vazsonyi E ^b   Jalsovszky, G ^c   Erostyak J ^d  

^a SORBONNE UNIVERSITÉ   (France)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^c CTRL RES INSTITUTE FOR CHEMISTRY   (Hungary)

^d UNIVERSITY OF PÉCS   (Hungary)

Author keywords

Oxidation; Oxides; Structural properties; Surface and interface states

Indexed keywords

ANODIC OXIDATION; INTERFACES (MATERIALS); OXIDES; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

ELECTRON PARAMAGNETIC RESONANCE SPECTROSCOPY; LOCAL VIBRATIONAL MODE;

POROUS SILICON;

EID: 0030120396     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08088-0     Document Type: Article

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