Investigation of the mechanisms controlling the stability of a porous silicon electroluminescent device

Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 281-284

  Simons, A J ^a   Cox, T I ^a   Loni, A ^a   Canham, L T ^a   Blacker, R ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

Electroluminescence; Electroluminescence stability; Porous silicon

Indexed keywords

DEGRADATION; DIFFUSION; ELECTRIC BREAKDOWN; ELECTRIC CONTACTS; ELECTROLUMINESCENCE; FABRICATION; GOLD; OXIDATION; OXIDES; PASSIVATION; POROUS SILICON; STABILITY;

ELECTROLUMINESCENCE STABILITY; INDIUM TIN OXIDE; INDIUM TIN OXIDE CONTACTS; SURFACE PASSIVATION;

LUMINESCENT DEVICES;

EID: 0031124048     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09484-9     Document Type: Article

References (4)

1. L.T. Canham, Appl. Phys. Lett., 57 (1990) 1046.
2. A. Loni, A.J. Simons, T.I. Cox, P.D.J. Calcott and L.T. Canham, Electron. Lett., 31 (1995) 1288.
3. A.J. Simons, T.I. Cox, A. Loni, L.T. Canham, M.J. Uren, C. Reeves, A.G. Cullis, P.D.J. Calcott, M.R. Houlton and J.P. Newey, in D.J. Lockwood, P.M. Fauchet, N. Koshida and S.R.J. Bruek (eds.), Proc. Int. Symp. on Advanced Luminescent Mater., Electrochem. Soc., PV 95-25, 1995, p. 73.
4. L.T. Canham, S.J. Saunders, I.B. Healey, A.M. Keir and T.I. Cox, Adv. Mater., 6 (1994) 865.