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Volumn 123-124, Issue , 1998, Pages 418-428
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Atomic-scale studies of electron transport through MOS structures
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRON EMISSION;
ELECTRON MICROSCOPY;
ELECTRON SPECTROSCOPY;
ELECTRON TRANSPORT PROPERTIES;
MONTE CARLO METHODS;
PALLADIUM;
PHONONS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DEVICE STRUCTURES;
BALLISTIC ELECTRON EMISSION MICROSCOPY;
BALLISTIC ELECTRON EMISSION SPECTROSCOPY;
MOS DEVICES;
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EID: 0031655266
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(97)00459-5 Document Type: Article |
Times cited : (7)
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References (24)
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