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Volumn 123-124, Issue , 1998, Pages 418-428

Atomic-scale studies of electron transport through MOS structures

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; MONTE CARLO METHODS; PALLADIUM; PHONONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0031655266     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00459-5     Document Type: Article
Times cited : (7)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.